L- and H-Tile Transceiver PHY User Guide

ID 683621
Date 7/20/2022
Public
Document Table of Contents

5.1.2.1.7. On-Die Instrumentation

The On-Die Instrumentation block allows users to monitor the eye width and height at the summing node of the DFE. This allows you to view the effect of the CTLE, VGA and DFE taps on the received signal.

Note: ODI is fully supported for H-Tile devices. However, for L-Tile devices, ODI is a functional diagnostic utility for remote system debug and link tuning, in other words, up to 25.8 Gbps. The ODI feature does not support relative channel-to-channel comparisons on L-Tile devices.

Refer to Debug Functions for details on how to use ODI.

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