Intel® Arria® 10 Core Fabric and General Purpose I/Os Handbook

ID 683461
Date 1/21/2022
Document Table of Contents Evaluating Your System’s Response to Functional Upsets

The ratio of SEU strikes versus functional interrupts is the Single Event Functional Interrupt (SEFI) ratio. Minimizing this ratio improves SEU mitigation. SEUs can randomly strike any memory element, system testing is important to ensure a comprehensive recovery response.

You can use fault injection to aid in SEU recovery response. The fault injection feature allows you to operate the FPGA in your system and inject random CRAM bit flips to test the ability of the FPGA and the system to detect and recover fully from an SEU. You should be able to observe your FPGA and your system recover from these simulated SEU strikes. You can then refine your FPGA and system recovery sequence by observing these strikes. You can determine the SEFI rate of your design by using the fault injection feature.