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1. Intel® Agilex™ General-Purpose I/O and LVDS SERDES Overview
2. Intel® Agilex™ I/O Features and Usage
3. Intel® Agilex™ I/O Termination
4. Intel® Agilex™ High-Speed SERDES I/O Architecture
5. I/O and LVDS SERDES Design Guidelines
6. Troubleshooting Guidelines
7. Documentation Related to the Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide
8. Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide Archives
9. Document Revision History for the Intel® Agilex™ General-Purpose I/O and LVDS SERDES User Guide
2.2.1. Programmable Output Slew Rate Control
2.2.2. Programmable IOE Delay
2.2.3. Programmable Open-Drain Output
2.2.4. Programmable Bus-Hold
2.2.5. Programmable Pull-Up Resistor
2.2.6. Programmable Pre-emphasis
2.2.7. Programmable De-emphasis
2.2.8. Programmable Differential Output Voltage
2.2.9. Schmitt Trigger Input Buffer
4.1. Intel® Agilex™ High-Speed SERDES I/O Overview
4.2. Using LVDS SERDES Intel FPGA IP for High-Speed LVDS I/O Implementation
4.3. Intel® Agilex™ LVDS SERDES Transmitter
4.4. Intel® Agilex™ LVDS SERDES Receiver
4.5. Intel® Agilex™ LVDS Interface with External PLL Mode
4.6. LVDS SERDES IP Initialization and Reset
4.7. Intel® Agilex™ LVDS SERDES Source-Synchronous Timing Budget
4.8. LVDS SERDES IP Timing
4.9. LVDS SERDES IP Design Examples
5.1.1. VREF Sources and VREF Pins
5.1.2. I/O Standards Implementation based on VCCIO_PIO Voltages
5.1.3. OCT Calibration Block Requirement
5.1.4. Placement Requirements
5.1.5. Simultaneous Switching Noise (SSN)
5.1.6. Special Pins Requirement
5.1.7. External Memory Interface Pin Placement Requirements
5.1.8. HPS Shared I/O Requirements
5.1.9. Clocking Requirements
5.1.10. SDM Shared I/O Requirements
5.1.11. Configuration Pins
5.1.12. Unused Pins
5.1.13. Voltage Setting for Unused I/O Banks
5.1.14. Guidelines for I/O Pins in GPIO, HPS, and SDM Banks During Power Sequencing
5.1.15. Drive Strength Requirement for GPIO Input Pins
5.1.16. Maximum DC Current Restrictions
5.1.17. 1.2 V I/O Interface Voltage Level Compatibility
5.1.18. GPIO Pins for Avalon-ST Configuration Scheme
5.1.19. Maximum True Differential Signaling RX Pairs Per I/O Lane
5.1.20. I/O Simulation
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1.3.1. I/O Buffer and Registers in Intel® Agilex™ Devices
I/O registers are composed of the input path for handling data from the pin to the core, the output path for handling data from the core to the pin, and the output enable (OE) path for handling the OE signal to the output buffer. These registers allow faster source-synchronous register-to-register transfers and resynchronization. Use the GPIO Intel FPGA IP to utilize these registers to implement DDR circuitry.
The input and output paths contain the following blocks:
- Input registers—support half/full rate data transfer from peripheral to the core, and support double or single data rate data captured from I/O buffer.
- Output registers—support half/full rate data transfer from core to peripheral, and support double or single data rate data transfer to I/O buffer.
- OE registers—support the output enable signal from core to the periphery, and double data rate / single data rate data transfer to I/O buffer.
The input and output paths also support the following features:
- Clock enable
- Asynchronous or synchronous reset
- Bypass mode for input and output paths
- Delay chain on input and output paths
Figure 3. IOE Structure for Intel® Agilex™ Devices