2.1. Using Provided HDL Templates 2.2. Instantiating IP Cores in HDL 2.3. Inferring Multipliers and DSP Functions 2.4. Inferring Memory Functions from HDL Code 2.5. Register and Latch Coding Guidelines 2.6. General Coding Guidelines 2.7. Designing with Low-Level Primitives 2.8. Recommended HDL Coding Styles Revision History
18.104.22.168. Use Synchronous Memory Blocks 22.214.171.124. Avoid Unsupported Reset and Control Conditions 126.96.36.199. Check Read-During-Write Behavior 188.8.131.52. Controlling RAM Inference and Implementation 184.108.40.206. Single-Clock Synchronous RAM with Old Data Read-During-Write Behavior 220.127.116.11. Single-Clock Synchronous RAM with New Data Read-During-Write Behavior 18.104.22.168. Simple Dual-Port, Dual-Clock Synchronous RAM 22.214.171.124. True Dual-Port Synchronous RAM 126.96.36.199. Mixed-Width Dual-Port RAM 188.8.131.52. RAM with Byte-Enable Signals 184.108.40.206. Specifying Initial Memory Contents at Power-Up
220.127.116.11. If Performance is Important, Optimize for Speed 18.104.22.168. Use Separate CRC Blocks Instead of Cascaded Stages 22.214.171.124. Use Separate CRC Blocks Instead of Allowing Blocks to Merge 126.96.36.199. Take Advantage of Latency if Available 188.8.131.52. Save Power by Disabling CRC Blocks When Not in Use 184.108.40.206. Initialize the Device with the Synchronous Load (sload) Signal
3.4.1. Apply Complete System-Centric Timing Constraints for the Timing Analyzer 3.4.2. Force the Identification of Synchronization Registers 3.4.3. Set the Synchronizer Data Toggle Rate 3.4.4. Optimize Metastability During Fitting 3.4.5. Increase the Length of Synchronizers to Protect and Optimize 3.4.6. Set Fitter Effort to Standard Fit instead of Auto Fit 3.4.7. Increase the Number of Stages Used in Synchronizers 3.4.8. Select a Faster Speed Grade Device
220.127.116.11.1. Typical and Worst-Case MTBF of Design
The MTBF Summary Report shows the Typical MTBF of Design and the Worst-Case MTBF of Design for supported fully-characterized devices. The typical MTBF result assumes typical conditions, defined as nominal silicon characteristics for the selected device speed grade, as well as nominal operating conditions. The worst-case MTBF result uses the worst case silicon characteristics for the selected device speed grade.
When you analyze multiple timing corners in the timing analyzer, the MTBF calculation may vary because of changes in the operating conditions, and the timing slack or available metastability settling time. Intel recommends running multi-corner timing analysis to ensure that you analyze the worst MTBF results, because the worst timing corner for MTBF does not necessarily match the worst corner for timing performance.
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