OCT Variation after Calibration at Device Power-Up
The OCT resistance may vary with the variation of temperature and voltage after calibration at device power-up.
Use the following table and equation to determine the final OCT resistance considering the variations after calibration at device power-up.
|Description||Nominal Voltage||dR/dT (%/°C)||dR/dV (%/mV)|
|OCT variation after calibration at device power-up||3.00||0.25||–0.027|
The definitions for equation are as follows:
- T1 is the initial temperature.
- T2 is the final temperature.
- MF is multiplication factor.
- Rinitial is initial resistance.
- Rfinal is final resistance.
- Subscript x refers to both V and T.
- ∆RV is variation of resistance with voltage.
- ∆RT is variation of resistance with temperature.
- dR/dT is the change percentage of resistance with temperature after calibration at device power-up.
- dR/dV is the change percentage of resistance with voltage after calibration at device power-up.
- V1 is the initial voltage.
- V2 is final voltage.
The following figure shows the example to calculate the change of 50 Ω I/O impedance from 25°C at 3.0 V to 85°C at 3.15 V.
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