Supply Current and Power Consumption
I/O Pin Leakage Current
Bus Hold Parameters
Series OCT without Calibration Specifications
Series OCT with Calibration at Device Power-Up Specifications
OCT Variation after Calibration at Device Power-Up
Pin Capacitance
Internal Weak Pull-Up Resistor
Hot-Socketing Specifications
Hysteresis Specifications for Schmitt Trigger Input
Single-Ended I/O Standards Specifications
Single-Ended SSTL, HSTL, and HSUL I/O Reference Voltage Specifications
Single-Ended SSTL, HSTL, and HSUL I/O Standards Signal Specifications
Differential SSTL I/O Standards Specifications
Differential HSTL and HSUL I/O Standards Specifications
Differential I/O Standards Specifications
True PPDS and Emulated PPDS_E_3R Transmitter Timing Specifications
True RSDS and Emulated RSDS_E_3R Transmitter Timing Specifications
Emulated RSDS_E_1R Transmitter Timing Specifications
True Mini-LVDS and Emulated Mini-LVDS_E_3R Transmitter Timing Specifications
True LVDS Transmitter Timing
Emulated LVDS_E_3R, SLVS, and Sub-LVDS Transmitter Timing Specifications
LVDS, TMDS, HiSpi, SLVS, and Sub-LVDS Receiver Timing Specifications
Maximum Allowed Overshoot During Transitions over a 11.4-Year Time Frame
During transitions, input signals may overshoot to the voltage listed in the following table and undershoot to –2.0 V for input currents less than 100 mA and periods shorter than 20 ns.
The maximum allowed overshoot duration is specified as a percentage of high time over the lifetime of the device. A DC signal is equivalent to 100% duty cycle.
For example, a signal that overshoots to 4.17 V can only be at 4.17 V for ~11.7% over the lifetime of the device; for a device lifetime of 11.4 years, this amounts to 1.33 years.
Condition (V) | Overshoot Duration as % of High Time | Unit |
---|---|---|
4.12 | 100.0 | % |
4.17 | 11.7 | % |
4.22 | 7.1 | % |
4.27 | 4.3 | % |
4.32 | 2.6 | % |
4.37 | 1.6 | % |
4.42 | 1.0 | % |
4.47 | 0.6 | % |
4.52 | 0.3 | % |
4.57 | 0.2 | % |