Agilex™ 5 FPGAs and SoCs Device Overview

ID 762191
Date 4/01/2024
Document Table of Contents

10.2. Features of the Hard Memory Controller

Table 18.  Hard Memory Controller Features
Feature Description
  • LPDDR5—two dynamic frequency scaling (DFS) frequencies
  • DDR4 and DDR5—up to two chip selects and up to two 3D stacks
  • Fully pipelined command, read, and write data interfaces to the controller
  • Arm* AMBA* 4 AXI compliance including AXI ordering rules:
    • Four priority quality of service (QoS) levels
    • Programmable address mapping
    • Exclusive monitors
  • Software-configurable priority scheduling on individual SDRAM bursts
  • Advanced bank look-ahead features for high memory throughput
  • Configurable for one of these placement orders:
    • Out-of-order placement for writes
    • In-order placement for writes from the same port
    • In-order placement for writes from the same AXI master
  • Configurable for in-order scheduling for reads and writes
  • Support read or write grouping
Timing Fully programmable timing parameter support for all JEDEC* -specified timing parameters
  • All bank refresh or per bank refresh (if supported by memory)
  • Refresh management for DDR5
  • Error correction code (ECC) support including calculation, error correction, write-back correction, and error counters
  • Hardened ECC support including configurations for various ECC types with programmable single-bit and double-bit error reporting and automatic correction:
    • In-line ECC, out-of-band ECC, link ECC, end-to-end (user) ECC, or no ECC
    • Supports standard single bit error correction and double bit error detection
    • Support for ECC passthrough for fabric ECC with 8 bits of ECC per 64 bits of data
    • Supports scrubbing
Power states Low power DRAM states including active power down, precharge power down, and self-refresh power down states for DRAM:
  • Under register control; or
  • Based on idle times
Training Initial and periodic ZQ calibration (LPDDR4, LPDDR5, DDR5)
  • Performance monitoring statistics
  • Memory test for DDR memories through register control