Embedded Design Handbook

ID 683689
Date 8/28/2023
Public
Document Table of Contents

6.3.2.1. Peripheral Testing

The first step in the board bring-up process is peripheral testing. Add one interface at a time to your design. After a peripheral passes the tests you have created for it, you should remove it from the test design. Designers typically leave the peripherals that pass testing in their design as they move on to test other peripherals. Sometimes this is necessary; however, it should be avoided when possible because multiple peripherals can create instability due to noise or crosstalk. By testing peripherals in a system individually, you can isolate the issues in your design to a particular interface.

A common failure in any system is involves memory. The most problematic memory devices operate at high speeds, which can result in timing failures. High performance memory also requires many board traces to transfer data, address, and control signals, which cause failures if not routed properly. You can use the Nios II processor to verify your memory devices using verification software. The Nios® II processor is not capable of stress testing your memory but it can be used to detect memory address and data line issues.

For more information on debugging refer to the Debugging Nios® II Designs chapter in this handbook.