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1.1. Comparison of the EPE and the Intel® Quartus® Prime Power Analyzer
1.2. Power Estimations and Design Requirements
1.3. Power Analyzer Walkthrough
1.4. Inputs for the Power Analyzer
1.5. Power Analysis in Modular Design Flows
1.6. Power Analyzer Compilation Report
1.7. Scripting Support
1.8. Power Analysis Revision History
1.4.2.1. Waveforms from Supported Simulators
1.4.2.2. .vcd Files from Third-Party Simulation Tools
1.4.2.3. Signal Activities from RTL (Functional) Simulation, Supplemented by Vectorless Estimation
1.4.2.4. Signal Activities from Vectorless Estimation and User-Supplied Input Pin Activities
1.4.2.5. Signal Activities from User Defaults Only
1.5.1. Complete Design Simulation
1.5.2. Modular Design Simulation
1.5.3. Multiple Simulations on the Same Entity
1.5.4. Overlapping Simulations
1.5.5. Partial Simulations
1.5.6. Node Name Matching Considerations
1.5.7. Glitch Filtering
1.5.8. Node and Entity Assignments
1.5.9. Default Toggle Rate Assignment
1.5.10. Vectorless Estimation
2.5.1. Clock Power Management
2.5.2. Pipelining and Retiming
2.5.3. Architectural Optimization
2.5.4. I/O Power Guidelines
2.5.5. Memory Optimization (M20K/MLAB)
2.5.6. DDR Memory Controller Settings
2.5.7. DSP Implementation
2.5.8. Reducing High-Speed Tile (HST) Usage
2.5.9. Unused Transceiver Channels
2.5.10. Periphery Power reduction XCVR Settings
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1.3.1. Device Operating Condition Settings for Power Analysis
You can specify device power characteristics, operating voltage conditions, and operating temperature conditions for power analysis in the Operating Settings and Conditions page of the Settings dialog box.
Operating Settings and Conditions
The Power Analyzer reads the following settings to determine the device operating conditions for power analysis:
Option | Settings |
---|---|
Device power characteristics |
|
Voltage tab | Specifies the operating voltage conditions for each power rail in the device, and the supply voltages for power rails with selectable supply voltages. |
Temperature tab | Specifies the thermal operating conditions of the device, including:
|