1.1. Failure Rates 1.2. Mitigating SEU Effects in Embedded User RAM 1.3. Mitigating SEU Effects in Configuration RAM 1.4. Internal Scrubbing 1.5. SEU Recovery 1.6. Intel® Quartus® Prime Software SEU FIT Reports 1.7. Triple-Module Redundancy 1.8. Evaluating a System's Response to Functional Upsets 1.9. CRAM Error Detection Settings Reference 1.10. Document Revision History
184.108.40.206. Architectural Vulnerability Factor
The Single Event Functional Interrupt (SEFI) ratio measures bit errors due to SEU strikes versus functional interrupts. Minimizing this ratio improves SEU mitigation.
10% SEFI factors are A typical specification to deflate the raw FIT to that observed in practice. For reference, the last two columns in the Projected SEU FIT by Component Usage report show AVF deflations for a conservative SEFI of 50% and a moderate SEFI of 25%.
SEFI represents a combination of factors. A utilization + ECC factor of 40% and AVF of 25% thus represents a global SEFI factor of 10%, because 0.4 × 0.25 = 0.1. An end-to-end SEFI factor of 10% is typical for a full design.
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