1.1. Features 1.2. Device Support 1.3. Resource Utilization and Performance 1.4. Installing and Licensing Intel® FPGA IP Cores 1.5. Customizing and Generating IP Cores 1.6. Functional Description 1.7. Using the Fault Injection Debugger and Fault Injection IP Core 1.8. Fault Injection IP Core User Guide Archives 1.9. Document Revision History for Fault Injection IP Core User Guide
- Allows you to evaluate system response for mitigating single event functional interrupts (SEFI).
- Allows you to perform SEFI characterization in-house, eliminating the need for entire system beam testing. Instead, you can limit the beam testing to failures in time (FIT)/Mb measurement at the device level.
- Scale FIT rates according to the SEFI characterization that is relevant to your design architecture. You can randomly distribute fault injections throughout the entire device, or constrain them to specific functional areas to speed up testing.
- Optimize your design to reduce disruption caused by a single event upsets (SEU).
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