Fault Injection Intel® FPGA IP Core User Guide

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ID 683254
Date 7/09/2019
Public
Document Table of Contents

1.1. Features

  • Allows you to evaluate system response for mitigating single event functional interrupts (SEFI).
  • Allows you to perform SEFI characterization in-house, eliminating the need for entire system beam testing. Instead, you can limit the beam testing to failures in time (FIT)/Mb measurement at the device level.
  • Scale FIT rates according to the SEFI characterization that is relevant to your design architecture. You can randomly distribute fault injections throughout the entire device, or constrain them to specific functional areas to speed up testing.
  • Optimize your design to reduce disruption caused by a single event upsets (SEU).

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