How Do I Use the EMIF Debug Toolkit?
For step-by-step instructions on how to daisy-chain multiple memory interfaces for compatibility with the EMIF Debug Toolkit, refer to the following user guide:
The Read/Write 2-D Eye Diagram feature available in the EMIF Debug Toolkit generates read-and-write eye diagrams for each data pin. Refer to the following video for information on important voltage reference parameters during the EMIF IP generation process and how to use the 2-D Eye Diagram feature:
The Traffic Generator 2.0 allows you to test and debug your external memory interface through customizable traffic and test patterns. Refer to the following guide and videos for detailed information on how to use the Traffic Generator 2.0 feature:
The Driver Margining feature allows you to capture read-and-write margining data per pin during user-mode traffic. Refer to the following videos for information on the differences between driver margining and calibration margining, and instructions on how to use the Driver Margining feature:
For information on how to debug an EMIF design, refer to the following online training curriculum: