Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide

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ID 683207
Date 7/27/2021
Public

2.3. IEEE Std. 1149.1 Boundary-Scan Register

The boundary-scan register is a large serial shift register that uses the TDI pin as an input and the TDO pin as an output. The boundary-scan register consists of boundary-scan cells for each I/O pin and padding bits. You can use the boundary-scan register to test external pin connections or to capture internal data.

Figure 2.  Boundary-Scan RegisterThis figure shows how test data is serially shifted around the periphery of the IEEE Std. 1149.1 device.

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