Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide

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ID 683207
Date 7/27/2021
Public

2.2. JTAG Pins

Table 1.  JTAG Pin Descriptions
Pin Function Description
TDI Serial input pin for:
  • Instructions
  • Test data
  • Programming data
  • TDI is sampled on the rising edge of TCK and should be driven on the falling-edge of TCK.
  • TDI pins have internal weak pull-up resistors.
TDO Serial output pin for:
  • Instructions
  • Test data
  • Programming data
  • TDO is driven on the falling edge of TCK and should be sampled on the rising-edge of TCK.
  • The pin is tri-stated if data is not being shifted out of the device.
TMS Input pin that provides the control signal to determine the transitions of the TAP controller state machine.
  • TMS is sampled on the rising edge of TCK and should be driven on the falling-edge of TCK.
  • TMS pins have internal weak pull-up resistors.
TCK The clock input to the BST circuitry.

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