Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide

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ID 683207
Date 7/27/2021
Public
Document Table of Contents
Document Table of Contents x
1. Intel® Stratix® 10 Overview 2. Intel® Stratix® 10 JTAG BST Architecture 3. Intel® Stratix® 10 BST Operation Control 4. Intel® Stratix® 10 I/O Voltage for JTAG Operation 5. Performing Intel® Stratix® 10 Boundary-Scan Testing 6. Enabling and Disabling Intel® Stratix® 10 BST Circuitry 7. Intel® Stratix® 10 IEEE Std. 1149.1 BST Guidelines 8. Document Revision History for the Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide
2. Intel® Stratix® 10 JTAG BST Architecture x
2.1. JTAG Circuitry Functional Model 2.2. JTAG Pins 2.3. IEEE Std. 1149.1 Boundary-Scan Register 2.4. IEEE Std. 1149.6 Boundary-Scan Register
2.3. IEEE Std. 1149.1 Boundary-Scan Register x
2.3.1. Boundary-Scan Cells of Intel® Stratix® 10 Device I/O Pin
2.4. IEEE Std. 1149.6 Boundary-Scan Register x
2.4.1. IEEE Std. 1149.6 BST Circuitry for Intel® Stratix® 10 E-Tile Transceiver 2.4.2. IEEE Std. 1149.6 BST Circuitry for Intel® Stratix® 10 P-Tile Transceiver
3. Intel® Stratix® 10 BST Operation Control x
3.1. Device ID 3.2. Supported JTAG Instructions 3.3. JTAG Secure Mode
6. Enabling and Disabling Intel® Stratix® 10 BST Circuitry x
6.1. Enabling BST Circuitry 6.2. Disabling BST Circuitry
1. Intel® Stratix® 10 Overview
2. Intel® Stratix® 10 JTAG BST Architecture
3. Intel® Stratix® 10 BST Operation Control
4. Intel® Stratix® 10 I/O Voltage for JTAG Operation
5. Performing Intel® Stratix® 10 Boundary-Scan Testing
6. Enabling and Disabling Intel® Stratix® 10 BST Circuitry
7. Intel® Stratix® 10 IEEE Std. 1149.1 BST Guidelines
8. Document Revision History for the Intel® Stratix® 10 JTAG Boundary-Scan Testing User Guide

2.1. JTAG Circuitry Functional Model

The JTAG BST circuitry requires the following registers:

  • Instruction register—determines which action to perform and which data register to access.
  • Bypass register (1-bit long data register)—provides a minimum-length serial path between the TDI and TDO pins.
  • Boundary-scan register—shift register composed of all the BSCs of the device.
Figure 1. JTAG Circuitry Functional Model
  • Test access port (TAP) controller—controls the JTAG BST.
  • TMS and TCK pins—operate the TAP controller.
  • TDI and TDO pins—provide the serial path for the data and instruction registers.
Note: TRST pin is not available in Intel® Stratix® 10 devices.
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