1. Test Methodology of Error Detection and Recovery using CRC in Intel® FPGA Devices
This application note describes how to use the enhanced error detection cyclic redundancy check (CRC) feature in the Arria® II, Stratix® III, Stratix® IV, Arria® V, Cyclone® V, and Stratix® V devices. It also describes the test methodology you can use when testing the capability of this feature in the supported devices. Arria® V, Cyclone® V, and Stratix® V devices also support error correction feature.
During FPGA configuration, the error detection CRC feature detects configuration bitstream corruption when the bitstream is transferred from an external device into the FPGA. In user mode, the error detection CRC feature detects a single event upset (SEU) and determines the error type and location. In addition, Arria® V, Cyclone® V, and Stratix® V devices support internal scrubbing, an ability to correct errors detected in user mode.
Did you find the information on this page useful?