General-Purpose I/O User Guide: Agilex™ 5 FPGAs and SoCs

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ID 813934
Date 4/05/2024
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Document Table of Contents
Document Table of Contents x
1. Agilex™ 5 General-Purpose I/O Overview 2. Agilex™ 5 HSIO Banks 3. Agilex™ 5 HVIO Banks 4. Agilex™ 5 HPS I/O Banks 5. Agilex™ 5 SDM I/O Banks 6. Agilex™ 5 I/O Troubleshooting Guidelines 7. GPIO Intel® FPGA IP 8. Programmable I/O Features Description 9. Document Revision History for the General-Purpose I/O User Guide: Agilex™ 5 FPGAs and SoCs
1. Agilex™ 5 General-Purpose I/O Overview x
1.1. Package Selection and I/O Vertical Migration Support 1.2. Types of I/O Banks
2. Agilex™ 5 HSIO Banks x
2.1. HSIO Bank Overview 2.2. HSIO Features 2.3. HSIO Implementation Guide 2.4. HSIO Termination 2.5. HSIO Design Guidelines 2.6. HSIO Simulation
2.1. HSIO Bank Overview x
2.1.1. HSIO Bank Structure 2.1.2. HSIO Buffers and Registers
2.2. HSIO Features x
2.2.1. Supported I/O Standards for HSIO Banks 2.2.2. HSIO Buffer Behavior 2.2.3. Programmable I/O Element Features for the HSIO Bank
2.2.3. Programmable I/O Element Features for the HSIO Bank x
2.2.3.1. Guidelines: Programmable Output Slew Rate Control 2.2.3.2. Guidelines: Programmable Pull-Up Resistor 2.2.3.3. Guidelines: Programmable De-Emphasis 2.2.3.4. Guidelines: Programmable Receiver Equalization Calibration
2.3. HSIO Implementation Guide x
2.3.1. I/O Assignments with the Quartus® Prime Assignment Editor 2.3.2. Assigning Pin I/O Standards in the Quartus® Prime Pin Planner
2.3.1. I/O Assignments with the Quartus® Prime Assignment Editor x
2.3.1.1. Assigning Pin I/O Standards in the Quartus® Prime Assignment Editor 2.3.1.2. Assigning Programmable IOE Features in the Quartus® Prime Assignment Editor 2.3.1.3. HSIO Programmable IOE Features Assignment Names and Settings
2.4. HSIO Termination x
2.4.1. Single-Ended I/O Termination in Agilex™ 5 Devices 2.4.2. True Differential Signaling I/O Termination in Agilex™ 5 Devices
2.4.1. Single-Ended I/O Termination in Agilex™ 5 Devices x
2.4.1.1. Single-Ended I/O Standards On-Chip Termination 2.4.1.2. OCT Calibration Block 2.4.1.3. Single-Ended I/O Standards External Termination 2.4.1.4. Single-Ended I/O Termination Implementation Guide
2.4.1.1. Single-Ended I/O Standards On-Chip Termination x
2.4.1.1.1. RS OCT 2.4.1.1.2. RT OCT 2.4.1.1.3. Dynamic OCT
2.4.1.4. Single-Ended I/O Termination Implementation Guide x
2.4.1.4.1. Configuring OCT Using the Assignment Editor 2.4.1.4.2. OCT Features Assignment Names and Settings
2.4.2. True Differential Signaling I/O Termination in Agilex™ 5 Devices x
2.4.2.1. True Differential Signaling I/O Standard On-Chip Termination 2.4.2.2. True Differential Signaling I/O Standard External Termination
2.4.2.1. True Differential Signaling I/O Standard On-Chip Termination x
2.4.2.1.1. Configuring Differential Input RD OCT Using the Assignment Editor 2.4.2.1.2. Guidelines: Differential Input RD OCT
2.5. HSIO Design Guidelines x
2.5.1. I/O Standard Placement Restrictions for True Differential I/Os 2.5.2. Placement Restrictions for True Differential and Single-Ended I/O Standards in the Same or Adjacent HSIO Bank 2.5.3. VREF Sources and Input Standards Grouping 2.5.4. HSIO Pin Restrictions for External Memory Interfaces 2.5.5. RZQ Pin Requirement 2.5.6. I/O Standards Implementation Based on VCCIO_PIO Voltages 2.5.7. I/O Standard Selection and I/O Bank Supply Compatibility Check 2.5.8. Simultaneous Switching Noise 2.5.9. HPS Shared I/O Requirements 2.5.10. Clocking Requirements 2.5.11. SDM Shared I/O Requirements 2.5.12. Unused Pins 2.5.13. VCCIO_PIO Supply for Unused HSIO Banks 2.5.14. HSIO Pins During Power Sequencing 2.5.15. Drive Strength Requirement for HSIO Input Pins 2.5.16. Maximum DC Current Restrictions 2.5.17. 1.05 V, 1.1 V, or 1.2 V I/O Interface Voltage Level Compatibility 2.5.18. Connection to True Differential Signaling Input Buffers During Device Reconfiguration 2.5.19. LVSTL700 I/O Standards Differential Pin Pair Requirements 2.5.20. Implementing a Pseudo Open Drain 2.5.21. Allowed Duration for Using RT OCT 2.5.22. Single-Ended Strobe Signal Differential Pin Pair Restriction 2.5.23. Implementing SLVS-400 or DPHY I/O Standard with 1.1 V VCCIO_PIO
2.6. HSIO Simulation x
2.6.1. IBIS Models—HSIO Support 2.6.2. IBIS-AMI Models 2.6.3. HSPICE* Models 2.6.4. Net Length Reports
3. Agilex™ 5 HVIO Banks x
3.1. HVIO Bank Overview 3.2. HVIO Features 3.3. HVIO Implementation Guide 3.4. HVIO Design Guidelines 3.5. HVIO Simulation
3.1. HVIO Bank Overview x
3.1.1. HVIO Bank Structure 3.1.2. HVIO Buffers and Registers
3.2. HVIO Features x
3.2.1. Supported I/O Standards for HVIO Banks 3.2.2. Dedicated Features of HVIO Pins 3.2.3. HVIO Buffer Behavior 3.2.4. Programmable I/O Element Features for the HVIO Bank
3.2.4. Programmable I/O Element Features for the HVIO Bank x
3.2.4.1. Guidelines: Programmable Open-Drain Output
3.3. HVIO Implementation Guide x
3.3.1. I/O Assignments with the Quartus® Prime Assignment Editor
3.3.1. I/O Assignments with the Quartus® Prime Assignment Editor x
3.3.1.1. Assigning Pin I/O Standards in the Quartus® Prime Assignment Editor 3.3.1.2. Assigning Programmable IOE Features in the Quartus® Prime Assignment Editor 3.3.1.3. HVIO Programmable IOE Features Assignment Names and Settings
3.4. HVIO Design Guidelines x
3.4.1. HVIO Pins During Power Sequencing 3.4.2. Unused HVIO Pins 3.4.3. VCCIO_HVIO Supply for Unused HVIO Banks 3.4.4. Maximum DC Current Restrictions
3.5. HVIO Simulation x
3.5.1. IBIS Models—HVIO Support 3.5.2. HSPICE* Models 3.5.3. Net Length Reports
4. Agilex™ 5 HPS I/O Banks x
4.1. HPS I/O Bank Overview 4.2. HPS I/O Features 4.3. HPS I/O Implementation Guide 4.4. HPS I/O Design Guidelines 4.5. HPS I/O Simulation
4.2. HPS I/O Features x
4.2.1. Supported I/O Standards for HPS I/O Banks 4.2.2. Programmable I/O Element Features for the HPS I/O Bank 4.2.3. HPS I/O Buffer Behavior
4.3. HPS I/O Implementation Guide x
4.3.1. Configuring Open Drain Feature for the HPS I/O 4.3.2. I/O Assignments with the Quartus® Prime Assignment Editor 4.3.3. Assigning Pin I/O Standards in the Quartus® Prime Pin Planner
4.3.2. I/O Assignments with the Quartus® Prime Assignment Editor x
4.3.2.1. Assigning Programmable IOE Features in the Quartus® Prime Assignment Editor 4.3.2.2. HPS I/O Programmable IOE Features Assignment Names and Settings
4.4. HPS I/O Design Guidelines x
4.4.1. HPS I/O Pins During Power Sequencing 4.4.2. HPS Shared I/O Requirements
4.5. HPS I/O Simulation x
4.5.1. IBIS Models—HPS I/O Support 4.5.2. Net Length Reports
5. Agilex™ 5 SDM I/O Banks x
5.1. SDM I/O Bank Overview 5.2. SDM I/O Features 5.3. SDM I/O Design Guidelines 5.4. SDM I/O Simulation
5.2. SDM I/O Features x
5.2.1. Supported I/O Standards for SDM I/O Banks 5.2.2. SDM I/O Buffer Behavior 5.2.3. I/O Standards and Features for Configuration Pins
5.3. SDM I/O Design Guidelines x
5.3.1. SDM I/O Pins During Power Sequencing 5.3.2. Avalon® Streaming Interface Dedicated Configuration Pins
5.4. SDM I/O Simulation x
5.4.1. IBIS Models—SDM I/O Support 5.4.2. Net Length Reports
7. GPIO Intel® FPGA IP x
7.1. Release Information for GPIO Intel® FPGA IP 7.2. Generating the GPIO Intel® FPGA IP 7.3. GPIO Intel® FPGA IP Parameter Settings 7.4. GPIO Intel® FPGA IP Interface Signals 7.5. GPIO Intel® FPGA IP Architecture 7.6. Verifying Resource Utilization and Design Performance 7.7. GPIO Intel® FPGA IP Timing 7.8. GPIO Intel® FPGA IP Design Examples
7.2. Generating the GPIO Intel® FPGA IP x
7.2.1. Intel® FPGA IP Generation Output
7.3. GPIO Intel® FPGA IP Parameter Settings x
7.3.1. Guideline: Swap datain_h and datain_l Ports in Migrated IP
7.4. GPIO Intel® FPGA IP Interface Signals x
7.4.1. Shared Signals 7.4.2. Data Bit-Order for Data Interface 7.4.3. Input and Output Bus High and Low Bits 7.4.4. Data Interface Signals and Corresponding Clocks
7.5. GPIO Intel® FPGA IP Architecture x
7.5.1. GPIO Intel® FPGA IP Data Paths 7.5.2. Register Packing
7.5.1. GPIO Intel® FPGA IP Data Paths x
7.5.1.1. Input Path 7.5.1.2. Output and Output Enable Paths
7.7. GPIO Intel® FPGA IP Timing x
7.7.1. Timing Components 7.7.2. Delay Elements 7.7.3. Timing Analysis 7.7.4. Timing Closure Guidelines
7.7.3. Timing Analysis x
7.7.3.1. Single Data Rate Input Register 7.7.3.2. DDIO Input Register 7.7.3.3. Single Data Rate Output Register 7.7.3.4. DDIO Output Register
7.8. GPIO Intel® FPGA IP Design Examples x
7.8.1. GPIO Intel® FPGA IP Synthesizable Quartus® Prime Design Example 7.8.2. GPIO Intel® FPGA IP Simulation Design Example
8. Programmable I/O Features Description x
8.1. Programmable Pre-Emphasis 8.2. Programmable De-Emphasis 8.3. Programmable Differential Output Voltage 8.4. Continuous Time Linear Equalization 8.5. Decision Feedback Equalization
1. Agilex™ 5 General-Purpose I/O Overview
2. Agilex™ 5 HSIO Banks
3. Agilex™ 5 HVIO Banks
4. Agilex™ 5 HPS I/O Banks
5. Agilex™ 5 SDM I/O Banks
6. Agilex™ 5 I/O Troubleshooting Guidelines
7. GPIO Intel® FPGA IP
8. Programmable I/O Features Description
9. Document Revision History for the General-Purpose I/O User Guide: Agilex™ 5 FPGAs and SoCs

8. Programmable I/O Features Description

Table 67.  I/O Features and Description
I/O Features Description
Programmable Output Slew Rate Control

Each I/O pin contains a slew rate control, allowing you to specify the slew rate on a pin-by-pin basis. The slew rate control affects both the rising and falling edges of the signal.

A faster slew rate provides high-speed transitions for high-performance systems while a slower slew rate reduces system noise and crosstalk but adds a nominal delay to the rising and falling edges.

Programmable IOE Delay

You can activate the programmable IOE delays to ensure zero hold time, minimize setup time, or increase the clock-to-output time. This feature helps read and write timing margins because it minimizes the uncertainties between signals on the bus.

Each pin can have a different input delay from the pin-to-input register or a delay from output register-to-output pin values. This is to ensure that the signals within a bus have the same delay going into or out of the device.

Programmable Current Strength

You can assign current strength setting to the single-ended output buffer.

For a list of I/O standards that support programmable current strength, refer to the related information.

The current strength setting is not supported for:

  • HSIO banks
  • Input-only pins
  • Pins with I/O standards that use true differential output buffers
  • Dedicated programming pins such as TDO
Programmable Open-Drain Output

The programmable open-drain output provides a high-impedance state on output when logic to the output buffer is high. If logic to the output buffer is low, the output is low.

You can attach several open-drain outputs to a wire. This connection type is like a logical OR function and is commonly called an active-low wired-OR circuit. If at least one of the outputs is in logic 0 state (active), the circuit sinks the current and brings the line to low voltage.

You can use open-drain output if you are connecting multiple devices to a bus. For example, you can use the open-drain output for system-level control signals that can be asserted by any device or as an interrupt.

Programmable Pull-Up Resistor

Each I/O pin on supported banks provides an optional programmable pull-up resistor during user mode. The pull-up resistor weakly holds the I/O to the I/O bank power supply level.

Programmable Pull-Down Resistor

Each I/O pin on supported banks provides an optional programmable pull-down resistor during user mode. The pull-down resistor weakly holds the I/O to the ground level.

Programmable Pre-Emphasis

Pre-emphasis momentarily boosts the high-frequency component of the output signal during switching to increase the output slew rate. The amount of pre-emphasis required depends on the attenuation of the high-frequency component along the transmission line.

For more information, refer to Programmable Pre-Emphasis.

Programmable De-Emphasis

De-emphasis attenuates the I/O signal height when the symbol is longer than the specified duration. You can use de-emphasis to alter the signal amplitude to compensate for signal degradation over long transmission path.

For more information, refer to Programmable De-Emphasis.

Receiver Equalization Calibration

The FPGAs support two types of receiver equalization calibration:

  • Continuous Time Linear Equalization (CTLE)—all HSIO input buffers support CTLE except for the 1.0 V, 1.05 V, 1.1 V, 1.2 V, and 1.3 V LVCMOS I/O standards. You can turn on CTLE for all external memory interface implementation except DDR5 and LPDDR5.
  • Decision Feedback Equalization (DFE)—you can turn on DFE for DDR5 and LPDDR5 external memory interface implementations.

For more information, refer to:
Programmable Differential Output Voltage

The programmable VOD settings allow you to adjust the output eye-opening to optimize the trace length and power consumption. A higher VOD swing improves voltage margins at the receiver end, and a smaller VOD swing reduces power consumption.

For more information, refer to Programmable Differential Output Voltage.

Schmitt Trigger

The Schmitt Trigger allows input buffers to respond to slow input edge rates with a fast output edge rate. Most importantly, Schmitt Triggers provide hysteresis on the input buffer, preventing slow-rising noisy input signals from ringing or oscillating on the input signal driven into the logic array.

This feature provides system noise tolerance on the device inputs but adds a small, nominal input delay.
On-Die Termination Impedance The HPS and SDM input pins support on-die pull-up and pull-down termination. The on-die termination provides impedance matching and termination capabilities. You can enable this feature on input operations to minimize reflections and improve electrical margins.

Section Content
Programmable Pre-Emphasis
Programmable De-Emphasis
Programmable Differential Output Voltage
Continuous Time Linear Equalization
Decision Feedback Equalization

Related Information
Level Two Title