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1. Intel Agilex® 7 JTAG BST Overview
2. Intel Agilex® 7 JTAG BST Architecture
3. Intel Agilex® 7 BST Operation Control
4. Intel Agilex® 7 I/O Voltage for JTAG Operation
5. Enabling and Disabling Intel Agilex® 7 BST Circuitry
6. Intel Agilex® 7 BST Guidelines
7. Document Revision History for the Intel Agilex® 7 JTAG Boundary-Scan Testing User Guide
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2.3. IEEE Std. 1149.1 Boundary-Scan Register
The boundary-scan register is a large serial shift register that uses the TDI pin as an input and the TDO pin as an output. The boundary-scan register consists of boundary-scan cells for each I/O pin and padding bits. You can use the boundary-scan register to test external pin connections or to capture internal data.
Figure 2. Boundary-Scan RegisterThis figure shows how test data is serially shifted around the periphery of the IEEE Std. 1149.1 device.