Agilex® 7 JTAG Boundary-Scan Testing User Guide

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ID 683748
Date 11/04/2024
Public
Document Table of Contents
Document Table of Contents x
1. Agilex® 7 JTAG BST Overview 2. Agilex® 7 JTAG BST Architecture 3. Agilex® 7 BST Operation Control 4. Agilex® 7 I/O Voltage for JTAG Operation 5. Enabling and Disabling Agilex® 7 BST Circuitry 6. Agilex® 7 BST Guidelines 7. Document Revision History for the Agilex® 7 JTAG Boundary-Scan Testing User Guide
2. Agilex® 7 JTAG BST Architecture x
2.1. JTAG Circuitry Functional Model 2.2. JTAG Pins 2.3. IEEE Std. 1149.1 Boundary-Scan Register 2.4. IEEE Std. 1149.6 Boundary-Scan Register
2.3. IEEE Std. 1149.1 Boundary-Scan Register x
2.3.1. Boundary-Scan Cells of Agilex® 7 Device I/O Pin
3. Agilex® 7 BST Operation Control x
3.1. Device ID 3.2. Supported JTAG Instructions
5. Enabling and Disabling Agilex® 7 BST Circuitry x
5.1. Enabling BST Circuitry 5.2. Disabling BST Circuitry
6. Agilex® 7 BST Guidelines x
6.1. Performing Agilex® 7 Boundary-Scan Testing 6.2. Agilex® 7 IEEE Std. 1149.1 BST Guidelines
1. Agilex® 7 JTAG BST Overview
2. Agilex® 7 JTAG BST Architecture
3. Agilex® 7 BST Operation Control
4. Agilex® 7 I/O Voltage for JTAG Operation
5. Enabling and Disabling Agilex® 7 BST Circuitry
6. Agilex® 7 BST Guidelines
7. Document Revision History for the Agilex® 7 JTAG Boundary-Scan Testing User Guide

2.3. IEEE Std. 1149.1 Boundary-Scan Register

The boundary-scan register is a large serial shift register that uses the TDI pin as an input and the TDO pin as an output. The boundary-scan register consists of boundary-scan cells for each I/O pin and padding bits. You can use the boundary-scan register to test external pin connections or to capture internal data.

Figure 2.  Boundary-Scan RegisterThis figure shows how test data is serially shifted around the periphery of the IEEE Std. 1149.1 device.

Section Content
Boundary-Scan Cells of Agilex 7 Device I/O Pin

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