Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

ID 683210
Date 11/01/2021

1. Intel® MAX® 10 JTAG BST Overview

Intel® MAX® 10 devices support the IEEE Std.1149.1 (JTAG) boundary-scan testing (BST).

When you perform BST, you can test pin connections without using physical test probes and capture functional data during normal operation. The boundary-scan cells (BSCs) in a device can force signals onto pins, or capture data from pins or core logic signals. Forced test data is serially shifted in from the TDI pin to the BSCs. Captured data is serially shifted out to the TDO pin for external comparison with expected results.

Note: You can perform BST on Intel® MAX® 10 devices before, after, and during configuration.

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