1. Intel® MAX® 10 JTAG BST Overview
When you perform BST, you can test pin connections without using physical test probes and capture functional data during normal operation. The boundary-scan cells (BSCs) in a device can force signals onto pins, or capture data from pins or core logic signals. Forced test data is serially shifted in from the TDI pin to the BSCs. Captured data is serially shifted out to the TDO pin for external comparison with expected results.
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