| SAMPLE/PRELOAD |
00 0000 0101 |
- Permits an initial data pattern to be an output at the device pins.
- Allows you to capture and examine a snapshot of signals at the device pins if the device is operating in normal mode.
|
| EXTEST 1 |
00 0000 1111 |
- Forces test pattern at the output pins and capture the test results at the input pins.
- Allows you to test the external circuitry and board-level interconnects.
|
| BYPASS |
11 1111 1111 |
- Places the 1-bit bypass register between the TDI and TDO pins.
- Allows the BST data to pass synchronously through target devices to adjacent devices during normal device operation.
|
| USERCODE |
00 0000 0111 |
- Places the 1-bit bypass register between the TDI and TDO pins.
- Allows you to shift the USERCODE register out of the TDO pin serially.
|
| IDCODE |
00 0000 0110 |
- Selects the IDCODE register and places it between the TDI and TDO pins.
- Allows you to shift the IDCODE register out of the TDO pin serially.
|
| HIGHZ 1 |
00 0000 1011 |
- Places the 1-bit bypass register between the TDI and TDO pins. The 1-bit bypass register tri-states all the I/O pins.
- Allow the BST data to pass synchronously through target devices to adjacent devices if device is operating in normal mode.
|
| CLAMP 1 |
00 0000 1010 |
- Places the 1-bit bypass register between the TDI and TDO pins. The 1-bit bypass register holds I/O pins to a state defined by the data in the boundary-scan register.
- Allow the BST data to pass synchronously through target devices to adjacent devices if device is operating in normal mode.
|
| USER0 |
00 0000 1100 |
- Allows you to define the scan chain between the TDI and TDO pins in the Intel® MAX® 10 logic array.
- Use this instruction for custom logic and JTAG interfaces.
|
| USER1 |
00 0000 1110 |
- Allows you to define the scan chain between the TDI and TDO pins in the Intel® MAX® 10 logic array.
- Use this instruction for custom logic and JTAG interfaces.
|