Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

ID 683210
Date 11/01/2021
Public

2.3.1. Boundary-Scan Cells in Intel® MAX® 10 I/O Pin

The Intel® MAX® 10 3-bit BSC contains the following registers:

  • Capture registers—connect to internal device data through OUTJ, OEJ, and PIN_IN signals.
  • Update registers—connect to external data through PIN_OUT and PIN_OE signals.
Figure 2. User I/O BSC with JTAG BST Circuitry for Intel® MAX® 10 Devices

The TAP controller generates the global control signals internally for the JTAG BST registers, shift, clock, and update. The instruction register generates the MODE signal.

The data signal path for the boundary-scan register runs from the serial data in (SDI) signal to the serial data out (SDO) signal. The scan register begins at the TDI pin and ends at the TDO pin of the device.

Table 2.  BSC Capture and Update Register for Intel® MAX® 10 Devices
Pin Type Captures Drives
Output Capture Register OE Capture Register Input Capture Register Output Update Register OE Update Register Input Update Register
User I/O OUTJ OEJ PIN_IN PIN_OUT PIN_OE INJ
Note: All VCC and GND pin types do not have BSCs.