Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

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ID 683210
Date 11/01/2021
Public
Document Table of Contents
Document Table of Contents x
1. Intel® MAX® 10 JTAG BST Overview 2. JTAG BST Architecture 3. BST Operation Control 4. I/O Voltage Support in the JTAG Chain 5. Enabling and Disabling JTAG BST Circuitry 6. Guidelines for JTAG BST 7. Boundary-Scan Description Language Support A. Document Revision History for the Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide
2. JTAG BST Architecture x
2.1. JTAG Pins 2.2. JTAG Circuitry Functional Model 2.3. JTAG Boundary-Scan Register
2.3. JTAG Boundary-Scan Register x
2.3.1. Boundary-Scan Cells in Intel® MAX® 10 I/O Pin
3. BST Operation Control x
3.1. JTAG IDCODE 3.2. JTAG Secure Mode 3.3. JTAG Private Instruction 3.4. JTAG Instructions
1. Intel® MAX® 10 JTAG BST Overview
2. JTAG BST Architecture
3. BST Operation Control
4. I/O Voltage Support in the JTAG Chain
5. Enabling and Disabling JTAG BST Circuitry
6. Guidelines for JTAG BST
7. Boundary-Scan Description Language Support
A. Document Revision History for the Intel® MAX® 10 JTAG Boundary-Scan Testing User Guide

2.3. JTAG Boundary-Scan Register

You can use the boundary-scan register to test external pin connections or to capture internal data. The boundary-scan register is a large serial shift register that uses the TDI pin as an input and the TDO pin as an output. The boundary-scan register consists of 3-bit peripheral elements that are associated with Intel® MAX® 10 I/O pins.

Section Content
Boundary-Scan Cells in Intel MAX 10 I/O Pin

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