Errata Sheet and Guidelines for MAX 10 ES Devices

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ID 683630
Date 6/12/2015
Public
Document Table of Contents
Document Table of Contents x
1. Device Errata for MAX 10 ES Devices 2. Device Guidelines for MAX® 10 ES Devices 3. Document Revision History
1. Device Errata for MAX 10 ES Devices x
1.1. ADC Prescalar 1.2. ESD Performance 1.3. Timing Model Adjustment
2. Device Guidelines for MAX® 10 ES Devices x
2.1. Recommended Power-up Sequencing for MAX 10 ES Devices 2.2. Full Chip Erase Prior to Initial Device Programming 2.3. Migration Guidelines
1. Device Errata for MAX 10 ES Devices
2. Device Guidelines for MAX® 10 ES Devices
3. Document Revision History

1. Device Errata for MAX 10 ES Devices

This errata sheet provides information about known device issues affecting MAX® 10 engineering sample (ES) devices.
Note:
  • ES devices are not intended to be used for volume production or device qualification testing.
  • ES devices are intended to be used at nominal voltage and nominal temperature only for DDR3 external memory interface (EMIF) support.
Table 1.  Device Errata for MAX 10 ES DevicesThis table lists the specific device issues and the affected MAX® 10 ES devices.
Issue Affected Devices Planned Fix
ADC Prescalar
  • ADC prescalar gain error
  • ADC prescalar THD performance
 10M08 ES Production Devices
ESD Performance

HBM ESD performance for MAX® 10 ES devices is below target level

10M08 ES Production Devices
Timing Model Adjustment

Timing model adjustment on I/O-to-Core and Core-to-I/O for MAX® 10 ES devices

10M08 ES Updated Timing Model in the Quartus II software version 15.0

Section Content
ADC Prescalar
ESD Performance
Timing Model Adjustment

Level Two Title