Intel® Quartus® Prime Pro Edition User Guide: Programmer

ID 683039
Date 10/04/2021
Public

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2.4.1.1. JTAG Chain Integrity Tab

Use the JTAG Chain Integrity tab to check the JTAG chain for potential failure, which can be caused by either a short circuit or an open JTAG circuit.

Figure 33. JTAG Chain Integrity Tab
Table 12.  JTAG Chain Integrity Tab
Pane Description
JTAG chain integrity test Run the Programmer Auto Detect feature, which detects devices in a chain and automatically adds supported devices to the Device list in the Programmer. The devices are added in the order in which they exist in the device chain.

If the Auto Detect feature fails to detect the JTAG chain, click Test JTAG Chain to run a JTAG chain integrity test to analyze the failure.

IDCODE iteration test Test for chain integrity and intermittent JTAG chain communication failure. This feature is turned off by default.
    • Run for<number>iterations–specify the number of tests that you want to repeat.
    • Run until stopped–cycle the test repeatedly until you click Stop.
The IDCODE iteration test cycles through Reset and Shift DR states to read IDCODEs from the device chain, and reports the following information:
  • When the IDCODEs read in each cycle of the test are the same, the result indicates that there are no inconsistencies or failures in the device chain.
  • When the IDCODEs read in each cycle are inconsistent, an error message is reported and the test terminates.

Results from the IDCODE iteration test appear in text format in the Session log pane and in graphic format in the Device chain pane.