In-Circuit Testers Support

Introduction

MAX® II, MAX® 3000A, MAX® 7000S, MAX® 7000A, and MAX® 7000B devices support for in-system programming (ISP) with in-circuit test (ICT) equipment, offer significant time and cost benefits by integrating programmable logic devices (PLDs) into board-level testing. ISP via in-circuit testers is accomplished with either an adaptive or constant algorithm. An adaptive algorithm reads information from a device and adapts subsequent programming steps to achieve the fastest possible programming time for that specific device. A constant algorithm uses a pre-defined (non-adaptive) programming sequence. Some tester platforms are well-suited to support adaptive algorithms while others are not. MAX II, MAX 3000A, and MAX 7000 devices can use adaptive or constant algorithms and work with either tester platform.

Related Documents

• AN 39: IEEE 1149.1 (JTAG) boundary-scan testing in Intel® FPGA devices
• AN 100: in-system programmability guidelines
• Using the Agilent 3070 Tester for In-System Programming
• AN 109: using the HP 3070 tester for in-system programming

Related Links

• Learn about Intel® FPGAs IEEE 1532 solution
• MAX® II handbook
• In-circuit testers vendor support
• IEEE 1532 programming
• Jam standard test and programming language (STAPL)
• Jam STAPL vendor support
• Boundary-scan tools
• Boundary-scan tools vendor support