This cloud-inspired SSD is built with an entirely new NVMe* controller, optimized for read intensive workloads and designed to maximize CPU utilization. With the Intel SSD DC P4501 Series, data centers can increase users, add more services, and perform more workloads per server. Now you can store more and know more.
Available in U.2 (2.5 in x 7mm) and M.2 (110mm x 22mm) form factors, and optimized for high performance-per-watt, power efficiency, and low power envelopes, this SSD enables new opportunities to maximize storage capacity without incurring the power demands of larger, space-consuming form factors.
With industry-leading quality and reliability, you can be confident your drives are available and your data is protected. Support for data-at-rest encryption minimizes the likelihood of data breaches, while industry-leading end-to-end data protection reduces the chance of silent data errors.1
Built with advanced manageability features such as NVMe*-MI, the Intel SSD DC P4501 Series allows you to remotely monitor, manage and remediate across more device states and streamline essential services.
Source - Intel. End-to-end data protection refers to the set of methods used to detect and correct the integrity of data across the full path as it is read or written between the host and the SSD controller and media. Test performed on Intel® SSD DC S3520, Intel® SSD DC P3520, Intel® SSD DC P3510, Intel® SSD DC P4500, Samsung* PM953, Samsung PM1725, Samsung PM961, Samsung PM863, Micron* 7100, Micron 510DC, Micron 9100, HGST* SN100, Seagate* 1200.2, SanDisk* CS ECO drives. Claim is based on average of Intel drive error rates vs. average of competitor drive error rates. Neutron radiation is used to determine silent data corruption rates and as a measure of overall end-to-end data protection effectiveness. Among the causes of data corruption in an SSD controller are ionizing radiation, signal noise and crosstalk, and SRAM instability. Silent errors were measured at run-time and at post-reboot after a drive “hang” by comparing expected data vs actual data returned by drive. The annual rate of data corruption was projected from the rate during accelerated testing divided by the acceleration of the beam (see JEDEC standard JESD89A).