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Presentation: Challenges and Innovations in Nano‐CMOS Transistor ScalingIntel’s Tahir Ghani reviews traditional scaling, modern innovations, and future challenges and options for Nano‐CMOS Transistor ScalingOutlineTraditional Scaling• Traditional Scaling Limiters• Intel’s ResponsePost Traditional-Scaling Innovations• Mobility Booter: Uniaxial Strain• Poly Depletion Elimination: Metal Gate• Gate Leakage Reduction: HiKFuture Challenges and Options•Power Limitation•Potential New Transistor Structures and MaterialsRead the full Challenges and Innovations in Nano‐CMOS Transistor Scaling Presentation.
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