Article ID: 000085149 Content Type: Troubleshooting Last Reviewed: 09/11/2012

Does Altera test configuration devices for Single Event Upsets (SEU)?

Environment

BUILT IN - ARTICLE INTRO SECOND COMPONENT
Description

No, Altera does not test configuration devices for SEU. 

Configuration devices are flash devices and are immune to neutrons and alpha particles.  There may be negligible SEU sensitivity in the logic registers and because of the very low failure rate, the devices are not tested.

Industry standard published literature and conference proceedings show that the failure in time rate (FIT rate) for such flash memory devices is very small.

Related Products

This article applies to 2 products

Intel® FPGA Configuration Devices
Intel® Programmable Devices

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