Intel’s approach to qualification focuses on ensuring high quality and reliability of our products. This encompasses design for testing (DFT), design for quality and reliability (DFR), design of efficient experiments (DOE), functional analysis, and comprehensive mathematical, statistical modeling to characterize reliability physics. Based on the needs of products and market segments, Intel uses JEDEC industry standards like JESD47 (stress-test driven qualification) and JESD94 (failure mechanism-based qualification, also known as knowledge-based qualification). Standards-based qualification is sufficient for established markets and technologies, while knowledge-based qualification is appropriate for new and emerging ones.
|Stress-test driven qualification (JESD47)||This methodology leverages a baseline set of acceptance tests for use in qualifying electronic components. Qualification is aimed at components used in commercial or industrial operating environments. This qualification standard is aimed at a generic qualification for a range of use conditions.||This methodology is sufficient for conventional technologies and market segments.||When the technology or the use applications change, it is challenging to evaluate the relevance and validity of the tests. The prescribed stress tests may either produce false failures or will not accelerate valid failure mechanisms because the stress conditions do not correlate appropriately to the actual use environment.|
|Knowledge-based qualification (JESD94)||This methodology customizes the stress testing to match the range of end use applications, based on knowledge of the customer’s end use application conditions, environment, lifetime requirements, physics of failure, and associated reliability models.||This approach facilitates comprehensive Q&R assessment for new and emerging markets and technologies. Characterization of physics of failure enables trade-off analysis of reliability, power, cost, and product performance.||Additional key information in the realm of environmental, lifetime, and manufacturing conditions is required to develop an application-specific qualification test sequence.|