In-Circuit Testers

Intel's MAX® II, MAX 3000A, MAX 7000S, MAX 7000A, and MAX 7000B devices support in-system programming (ISP) with in-circuit test (ICT) equipment, offering significant time and cost benefits by integrating programmable logic devices (PLDs) into board-level testing. ISP via in-circuit testers is accomplished with either an adaptive or constant algorithm. An adaptive algorithm reads information from a device and adapts subsequent programming steps to achieve the fastest possible programming time for that specific device. A constant algorithm uses a pre-defined (non-adaptive) programming sequence. Some tester platforms are well-suited to support adaptive algorithms while others are not. MAX II, MAX 3000A and MAX 7000 devices can use adaptive or constant algorithms and work with either tester platform.

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