When multiple memory interfaces are implemented in the same I/O column with the EMIF Debug Toolkit option disabled, you may see calibration or memory test failures due to data corruption during calibration. Memory test failures may occur even if calibration passes.
This issue affects all memory interface protocols & all combinations of protocols that share an I/O column.
Implementations with a single memory interface in an I/O column are not affected, and designs will pass.
This issue affects designs using Arria® 10 devices (ES, ES2, Production) and the Quartus® II software versions 15.0.2 and earlier.