BBISTCTRL
BIST Control Register
- Used only in BIST MODE
Module Instance | Base Address | Register Address |
---|---|---|
i_usb31_0__ahb_slave__11000000__DWC_usb31_block_debug__SEG_L4_AHB_USB1_0x0_0x100000
|
0x1100D800
|
0x1100D90C
|
Size: 32
Offset: 0x10C
Access: RW
Bit Fields | |||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
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BBISTCTRL Fields
Bit | Name | Description | Access | Reset |
---|---|---|---|---|
31 |
start_BIST_test
|
Start BIST Test - 1'b0 : Stop Test - 1'b1 : Start Test This bit is cleared when the test is completed. |
RW
|
0x0
|
30 |
BIST_test_type
|
BIST Test Type - 1'b0 : BIST Transfer loopback test - 1'b1 : BIST Register/RAM test |
RW
|
0x0
|
29 |
fail
|
fail |
RW
|
0x0
|
28:27 |
reserved_28_27
|
Reserved |
RW
|
0x0
|
26:24 |
BIST_pattern
|
BIST Pattern - 3'b000: Use same pattern - 3'b001: Alternate Invert (If start will AA, then it will perform AA/55 BIST pattern) - 3'b010: Increment Pattern - 3'b011: LSFR - 3'b100: Shift right (Walking 1 and Walking 0 testing) - others: Reserved |
RW
|
0x0
|
23:0 |
BIST_iteration_cnt
|
BIST Iteration Count - 0: Continuous till stop/fail - x(others): Iteration till count x stop/fail |
RW
|
0x0
|