Intel® Agilex™ FPGAs and SoCs Device Overview

ID 683458
Date 9/26/2022
Public
Document Table of Contents
1. Overview of the Intel® Agilex™ FPGAs and SoCs 2. Intel® Agilex™ FPGAs and SoCs Family Plan 3. Second Generation Intel® Hyperflex™ Core Architecture 4. Adaptive Logic Module in Intel® Agilex™ FPGAs and SoCs 5. Internal Embedded Memory in Intel® Agilex™ FPGAs and SoCs 6. Variable-Precision DSP in Intel® Agilex™ FPGAs and SoCs 7. Core Clock Network in Intel® Agilex™ FPGAs and SoCs 8. General Purpose I/Os in Intel® Agilex™ FPGAs and SoCs 9. I/O PLLs in Intel® Agilex™ FPGAs and SoCs 10. External Memory Interface in Intel® Agilex™ FPGAs and SoCs 11. Hard Processor System in Intel® Agilex™ SoCs 12. FPGA Transceivers in Intel® Agilex™ FPGAs and SoCs 13. Heterogeneous 3D Stacked HBM2E DRAM Memory in Intel® Agilex™ M-Series FPGAs and SoCs 14. High-Performance Crypto Blocks in Intel® Agilex™ F-Series and I-Series FPGAs and SoCs 15. MIPI* Protocols Support in Intel® Agilex™ D-Series FPGAs and SoCs 16. Balls Anywhere Package Design of Intel® Agilex™ D-Series FPGAs and SoCs 17. Configuration via Protocol Using PCIe* for Intel® Agilex™ FPGAs and SoCs 18. Device Configuration and the SDM in Intel® Agilex™ FPGAs and SoCs 19. Partial and Dynamic Configuration of Intel® Agilex™ FPGAs and SoCs 20. Device Security for Intel® Agilex™ FPGAs and SoCs 21. SEU Error Detection and Correction in Intel® Agilex™ FPGAs and SoCs 22. Power Management for Intel® Agilex™ FPGAs and SoCs 23. Intel® Software and Tools for Intel® Agilex™ FPGAs and SoCs 24. Revision History for the Intel® Agilex™ FPGAs and SoCs Device Overview

21.1. Additional SEU Mitigation Features in Intel® Agilex™ D-Series FPGAs and SoCs

Intel® Agilex™ D-Series FPGAs and SoCs also support the following additional SEU mitigation features:

  • Fast SEU detection notification through an IP that connects the LSM pin to the fabric. This notification allows the fabric soft logic to detect reported SEU events faster. You can then retrieve further SEU details through the SDM mailbox.
  • External scrubbing for SEU errors that are not automatically correctable. You can create scrubbing bitstream—up to one sector granularity—to scrub the SEU-corrupted configuration bits while keeping the remaining parts of the device intact.
  • Single-bit ECC injection, ECC error detection, and reporting on memory in the configuration system. You can test the ECC detection logic by issuing ECC injection commands and querying the ECC status from the SDM.

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