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Volume 12, Issue 02

Intel's 45nm CMOS Technology

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ISSN 1535-864X DOI 10.1535/itj.1202.02

• Volume 12
• Issue 02
• Published June 17, 2008

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Intel's 45nm CMOS Technology

  Section 6 of 8  

Process and Electrical Results for the On-die Interconnect Stack for Intel's 45nm Process Generation

ACKNOWLEDGMENTS

We gratefully acknowledge the Portland Technology Development Group and the TD Quality and Reliability Engineering organizations for their contributions to this work.

  Section 6 of 8  

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In this article

• Abstract
• Introduction
• Results
• Discussion
• Conclusion
• Acknowledgments
• References
• Authors' Biographies