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Technology with the Environment in Mind
Materials Technology for Environmentally Green Micro-electronic Packaging
REFERENCES
[1] Daewoong Suh et al., "Effects of Ag content on fracture resistance of Sn-Ag-Cu lead-free solders under high strain rate conditions," Materials Science and Engineering A, 46-461, 2008, pps. 595–603.
[2] Vasu Vasudevan et al., "Slow Cycle Fatigue Creep Performance of Pb-free (LF) Solders," ECTC, 2008.
[3] Irina Boguslavsky et al., "Recrystallization Principles Applied to Whisker Growth in Tin", APEX Conference, March 31, 2003, Anaheim, CA, pps. 1–14.
[4] R. Mahajan et al., "Advances and Challenges in Flip-Chip Packaging," IEEE 2006 Custom Integrated Circuits Conference, (CICC), 2006.
[5] V. Wakharkar et al., "Microelectronic Packaging Materials Development & Integration Challenges for Lead Free," TMS Conference, 2006.
[6] Carl Deppisch et al., "Material Optimization and Reliability Characterization of Indium Solder Thermal Interface Materials for 1262 Package technology," IATTJ Journal, Vol. 5, 2002, pps. 227–240.
[7] Smithell's Metals Reference Book, E. A. Brandes and G.B. Brook (editors), Seventh edition, 1992, Butterworth Heineman, London, England.
[8] JEDEC J-STD-020.
In this article
- Abstract
- Introduction
- PB-Free Initiative: First Level Interconnect Materials (FLI)
- PB-Free Initiative: Second Level Interconnect Materials (2LI)
- PB-Free Initiative: Solder Thermal Interface Materials (STIM)
- Halogen-Free Packaging Materials Initiative
- Conclusion
- Acknowledgments
- References
- Author's Biographies
