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Intel Published Articles Published in or about Q1, 2006

  • Allain, J. P.; Nieto, M.; Hassaneub, A.; Titoy, V.; Plotkin, P.; Hendricks, M.; Hinson, E.; Chrobak, C.; Van Der Velden, M. H. L.; Rice, B. Effect of Charged-Particle Bombardment on Collector Mirror Reflectivity in EUV Lithography Devices. Proceedings of SPIE—Volume 6151, Emerging Lithographic Technologies X, March 2006.
  • Ayothi, Ramakrishnan; Yi; Yi; Ober, Christopher K.; Putna, Steve; Yueh, Wang; Cao, Heidi. All-Organic Non-PFOS Nonionic Photoacid Generating Compounds With Functionalized Fluoroorganic Sulfonate Motif for Chemically Amplified Resists. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Balasubramanian, S.; Natarajan, N.; Franza, O.; Gianos, C. Deterministic Low-Latency Data Transfer Across Non-Integral Ratio Clock Domains. 19th International Conference on VLSI Design,2006, held jointly with 5th International Conference on Embedded Systems and Design, January 2006. Pages 781-785. Digital Object Identifier 10.1109/VLSID.2006.71.
  • Borin, E.; Wang, C.; Wu, Y.; Araujo, G. Software-Based Transparent and Comprehensive Control-Flow Error Detection. International Symposium Code Generation and Optimization, CGO 2006, March2006. Pages 333-345. Digital Object Identifier 10.1109/CGO.2006.33.
  • Bormann, David S. GALS Test Chip on 130nm Process. Electronic Notes in Theoretical Computer Science, Volume 146, Issue 2, January 2006. Pages 29-40.
  • Borodovsky, Yan. Marching to the Beat of Moore's Law. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Bowman, K.; Orshansky, M.; Sapatnekar, S.S. Tutorial II: Variability and Its Impact on Design. 7th International Symposium on Quality Electronic Design, March 2006. Page 5. Digital Object Identifier 10.1109/ISQED.2006.141.
  • Bozzano, Marco; Bruttomesso, Roberto; Cimatti, Alessandro; Franzé, Anders; Hanna, Ziyad; Khasidashvili, Zurab; Palti, Amit; Sebastiani, Roberto. Encoding RTL Constructs for Math SAT: a Preliminary Report. Electronic Notes in Theoretical Computer Science, Volume 144, Issue 2, January 2006. Pages 3-4.
  • Bratton, Daniel; Ayothi, Ramakrishnan; Felix, Nelson; Cao, Heidi; Deng, Hai; Ober, Christopher K. Molecular Glass Resists for Next Generation Lithography. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Brevnov, Dmitri A.; Womack, Robin L.; Atanassov, Plamen; López, Gabriel P.; Bauer, Todd M.; Chaudhury, Zariff A.; Schwappach, Chris D.; Mosley, Larry E. Width of Anodization Mask Required toPreserve a Metallic Phase during Porous-Type Anodization of Aluminum-Copper Films. J. Electrochem. Soc., Volume 153, Issue 3, 2006. Pages B108-B112.
  • Burnett, John H.; Kaplan, Simon G.; Shirley, Eric L.; Horowitz, Deane; Clauss, Wilfried; Grenville, Andrew; Peski, Chris Van. High-Index Optical Materials for 193nm Immersion Lithography. Proceedings of SPIE—Volume 6154, Optical Microlithography XIX, March 2006.
  • Chakravorty, Kishore K.; Henrichs, Sven; Qiu, Wei; Chavez, Joas L.; Liu, Yi-Ping; Ghadiali, Firoz; Yung, Karmen; Wilcox, Nathan; Silva, Mary; Ma, Jian; Qu, Ping; Irvine, Brian; Yun, Henry; Cheng, Wen-Hao; Farnsworth, Jeff. Alternating Phase Shift Mask Technology for 65nm Logic Applications. Proceedings of SPIE—Volume 6154, Optical Micro-lithography XIX, March 2006.
  • Chen, Yen-Kuang; Li, Eric Q.; Zhou, Xiaosong; Ge, Steven. Implementation of H.264 Encoder and Decoder on Personal Computers. Journal of Visual Communication and Image Representation, Volume17, Issue 2, April 2006. Pages 509-532.
  • Chen, Yijian; Yashesh Shroff, Yashesh. The Effects of Wafer-Scan Induced Image Blur on CD Control, Image Slope, and Process Window in Maskless Lithography. Proceedings of SPIE—Volume6151, Emerging Lithographic Technologies X, March 2006.
  • Conchon, Sylvain ; Krstic, Sava. Strategies for Combining Decision Procedures. Theoretical Computer Science, Volume 354, Issue 2, March 2006. Pages 187-210.
  • Debnath, G.; Thadikaran, P. Design Challenges for High Performance Nano-Technology. 19th International Conference on VLSI Design, held jointly with 5th International Conference on Embedded Systems and Design, January 2006. Pages 12-13. Digital Object Identifier 10.1109/VLSID.2006.64.
  • Fedynyshyn, Theodore H.; Sinta, R. F.; Astolfi, D. K.; Cabral, Alberto; Roberts, J.; Meagley,R. Deconstructing the Resist to Probe Innate Material Roughness. Proceedings of SPIE—Volume6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Fetzer, E.S.; Dahle, D.; Little, C.; Safford, K. The Parity Protected, Multithreaded Register Files on the 90-nm Itanium Microprocessor. IEEE Journal of Solid-State Circuits, Volume 41, Issue1, January 2006. Pages 246-255. Digital Object Identifier 10.1109/JSSC.2005.859884
  • Fischer, T.; Desai, J.; Doyle, B.; Naffziger, S.; Patella, B. A 90-nm Variable Frequency Clock System for a Power-Managed Itanium Architecture Processor. IEEE Journal of Solid-State Circuits,Volume 41, Issue 1, January 2006. Pages 218-228. Digital Object Identifier 10.1109/JSSC.2005.859879.
  • Fryer, David; Singh, Vivek; Muray, Andrew; Dhoot, Sushil; Sivakumar, Sam. Defect Marginality Screen for Resists Patterned in Random Bright Field Layout. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Gandhi, A.; Akkary, H.; Rajwar, R.; Srinivasan, S.T.; Lai, K. Scalable Load and Store Processing in Latency-Tolerant Processors. IEEE on Micro, Volume 26, Issue 1, January – February2006. Pages 30-39. Digital Object Identifier 10.1109/MM.2006.21.
  • Grundy, Jim; Melham, Tom; Krstic, Sava; McLaughlin, Sean. Tool Building Requirements for an API to First-Order Solvers. Electronic Notes in Theoretical Computer Science, Volume 144, Issue 2, January 2006. Pages 15-26.
  • He, M.Y.; Poulton, J. A CMOS Mixed-Signal Clock and Data Recovery Circuit for OIF CEI-6G+Backplane Transceiver. IEEE Journal of Solid-State Circuits, Volume 41, Issue 3, March 2006.Pages 597-606. Digital Object Identifier 10.1109/JSSC.2006.869792.
  • Hill, S. B.; Ermanoski, I.; Grantham, S.; Tarrio, C.; Lucatorto, T. B.; Madey, T. E.; Bajt, S.;Chandhok, M.; Yan, P.; Wood, O.; Wurm, S.; Edwards, N. V. EUV Testing of Multilayer Mirrors:Critical Issues. Proceedings of SPIE—Volume 6151, Emerging Lithographic Technologies X, March 2006.
  • Hon, Man Chung. Spec-Based Flip-Flop and Latch Repeater Planning. Proceedings of the 2006 Conference on Asia South Pacific Design Automation, January 2006. Pages 326-331.
  • Hong, Jumnit; Nurvitadhi, Eriko; Lu, Shih-Lien L. Design, Implementation, and Verification ofActive Cache Emulator (ACE). Proceedings of the International Symposium on Field Programmable GateArrays, February 2006. Pages 63-72.
  • Hsu, S.K.; Mathew, S.K.; Anders, M.A.; Zeydel, B.R.; Oklobdzija, V.G.; Krishnamurthy, R.K.;Borkar, S.Y. A 110 GOPS/W 16-bit Multiplier and Reconfigurable PLA Loop in 90-nm CMOS. IEEEJournal on Solid-State Circuits, Volume 41, Issue 1, January 2006. Pages 256-264. Digital Object Identifier 10.1109/JSSC.2005.859893.
  • Huggins, Kevin; Tsuyoshi, Toki; Ong; Meng; Rafac, Robert; Treadway, Christopher; Choudhary,Devashish; Kudo, Takehito; Hirukawa, Shigeru; Renwick, Stephen P.; Farrar, Nigel R. Effects ofLaser Bandwidth on OPE in a Modern Lithography Tool. Proceedings of SPIE—Volume 6154, Optical Microlithography XIX, March 2006.
  • Hussein, M.A.; Turkot, R.B., Jr. Particle Control in Dielectric Etch Chamber. IEEE Transactions on Semiconductor Manufacturing, Volume 19, Issue 1, February 2006. Pages 146-155.Digital Object Identifier 10.1109/TSM.2005.863224.
  • Hutapea, Parsaoran; Grenestedt, Joachim L.; Modi; Mitul; Mello, Michael; Frutschy, Kristopher.Prediction of Microelectronic Substrate Warpage Using Homogenized Finite Element Models. Microelectronic Engineering, Volume 83, Issue 3, March 2006. Pages 557-569.
  • Iyer, P.; Jain, S.; Casper, B.; Howard, J. Testing High-Speed IO Links Using On-Die Circuitry. 19th International Conference on VLSI Design, held Jointly with 5th International Conference on Embedded Systems and Design, January 2006. Pages 807-810. Digital Object Identifier 10.1109/VLSID.2006.159.
  • Jaleel, A.; Mattina, M.; Jacob, B. Last Level Cache (LLC) Performance of Data Mining Workloads on a CMP—a Case Study of Parallel Bioinformatics Workloads. Twelfth International Symposium on High-Performance Computer Architecture, February 2006. Pages 88-98. Digital Object Identifier10.1109/HPCA.2006.1598115.
  • Jarnagin, N. D.; Gonsalves, K. E.; Wang, M. X.; Roberts, J. M.; Yueh, W. Resists for Sub-100nm Patterning at 193nm Exposure. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Jianhui Li; Qi Zhang; Shu Xu; Bo Huang. Optimizing Dynamic Binary Translation for SIMD Instructions. International Symposium on Code Generation and Optimization, March 2006. Pages 269-280. Digital Object Identifier 10.1109/CGO.2006.27.
  • Jiao, Y.; Fan, S.; Miller, D.A.B. Systematic Photonic Crystal Device Design: Global and Local Optimization and Sensitivity Analysis. IEEE Journal of Quantum Electronics, Volume 42, Issue 3,March 2006. Pages 266-279. Digital Object Identifier 10.1109/JQE.2005.862038.
  • Jones, Ronald L.; Wu, Wen-li; Wang, Cheng-qing; Lin, Eric K.; Choi, Kwang-Woo; Rice, Bryan J.; Thompson, George M.; Weigand, Steven J.; Keane, Denis T. Characterization of Line Edge Roughness Using CD SAXS. Proceedings of SPIE—Volume 6152, Metrology, Inspection, and Process Control for Microlithography XX, March 2006.
  • Kang, Wei; Mao, John. Benchmark Comparison of Multiple Process Control Strategies for Lithographic CD control. Proceedings of SPIE—Volume 6152, Metrology, Inspection, and Process Control for Microlithography XX, March 2006.
  • Kilic, B.; Madenci, E.; Mahajan, R. Energy Release Rate and Contact Zone in a Cohesive and an Interface Crack by Hypersingular Integral Equations. International Journal of Solids andStructures, Volume 43, Issue 5, March 2006. Pages 1159-1188.
  • Kocsis, Michael; van den Heuvel, Dieter; Gronheid, Roel; Maenhoudt, Mireille; Vangoidsenhoven, Dizana; Wells, Greg; Stepanenko, Nickolay; Benndorf, Michael; Kim, Hyun Woo; Kishimura, Shinji; Ercken, Monique; Van Roey, Frieda; O'rien, S.; Fyen, Wim; Foubert, Philippe; Moerman, Richard; Streefkerk, Bob. Immersion Specific Defect Mechanisms: Findings and Recommendations for Their Control. Proceedings of SPIE—Volume 6154, Optical Microlithography XIX, March 2006.
  • Lacopi, F.; Travaly, Y.; Eyckens, B.; Waldfried, C.; Abell, T.; Guyer, E. P.; Gage, D. M.; Dauskardt, R. H.; Sajavaara, T.; Houthoofd, K.; Grobet, P.; Jacobs, P.; Maex, K.. Short-Ranged Structural Rearrangement and Enhancement of Mechanical Properties of Organosilicate Glasses Inducedby Ultraviolet Radiation. Journal of Applied Physics, March 2006, Volume 99.
  • Lavery, Kristopher A.; Choi, Kwang-Woo; Vogt, Bryan D.; Prabhu, Vivek M.; Lin, Eric K.; Wu, Wen-li; Satija, Sushil K.; Leeson, Michael J.; Cao, Heidi B.; Thompson, George; Deng, Hai; Fryer,David S. Fundamentals of the Reaction-Diffusion Process in Model EUV Photoresists. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Lee, Cheng-Tsung; Jarnagin, Nathan D.; Wang, Mingxing; Gonsalves, Kenneth E.; Roberts, Jeanette M.; Yueh, Wang; Henderson, Clifford L. Fundamental Studies of the Properties of Photoresists Based on Resins Containing Polymer-Bound Photoacid Generators. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Lee, Kyung M.; Yedur, Sanjay; Henrichs, Sven; Tavassoli, Malahat. CD-Etch Depth Measurement from Advanced Phase-Shift Masks and Wafers Using Optical Scatterometry. Proceedings of SPIE—Volume 6152, Metrology, Inspection, and Process Control for Microlithography XX, March 2006.
  • Lee, Sang H.; Brewer, Courtney; Chandhok, Manish. Process Window Study with Various Partial Coherences on EUV MET (micro exposure tool) Optics. Proceedings of SPIE—Volume 6151, EmergingLithographic Technologies X, March 2006.
  • Liao, S.; Du; Z.; Wu, G.; Lueh, G. Data and Computation Transformations for Brook StreamingApplications on Multiprocessors. International Symposium on Code Generation and Optimization, March2006. Pages 196-207. Digital Object Identifier 10.1109/CGO.2006.13.
  • Liberman, V.; Switkes, M.; Rothschild, M.; Palmacci, S.T.; Grenville, A. Studies of Consequences of Photo-Acid Generator Leaching in 193nm Immersion Lithography. Proceedings of SPIE —Volume 6154, Optical Microlithography XIX, March 2006.
  • Liu, A.; Rong, H.; Jones, R.; Cohen, O.; Hak, D.; Paniccia, M. Optical Amplification andLasing by Stimulated Raman Scattering in Silicon Waveguides. Journal of Lightwave Technology,Volume 24, Issue 3, March 2006. Pages 1440-1455. Digital Object Identifier 10.1109/JLT.2005.863322.
  • Long, M.; Wu, C.-H. Energy-Efficient and Intrusion-Resilient Authentication for Ubiquitous Access to Factory Floor Information. IEEE Transactions on Industrial Informatics, Volume 2, Issue1, February 2006. Pages 40-47. Digital Object Identifier 10.1109/TII.2005.864144.
  • Ma, H. B.; Wilson, C.; Borgmeyer, B.; Park, K.; Yu, Q.; Choi, S. U. S.; Tirumala, Murli.Effect of Nanofluid on the Heat Transport Capability in an Oscillating Heat Pipe. Applied Physics Letters, Volume 88, April 2006.
  • Ma, Jian; Farnsworth, Jeff; Bassist, Larry; Cui, Ying; Mammen, Bobby; Padmanaban, Ramaswamy; Nadamuni, Venkatesh; Kamath, Muralidhar; Buckmann, Ken; Neff, Julie; Freiberger, Phil.Development of an Automated Multiple-Target Mask CD Disposition System to Enable New Sampling Strategy. Proceedings of SPIE—Volume 6152, Metrology, Inspection, and Process Control for Microlithography XX, March 2006.
  • Maris, Humphrey J.; Antonelli, G. Andrew; Ford, Wayne K.; Morath, Christopher J.; Stoner,Robert J.; Tas, Guray. Non-Destructive Testing Using Picosecond Ultrasonics. AIP Conference Proceedings, Volume 820, Issue 1, March 2006. Pages 210-217.
  • McCloskey, Bill; Zhou, Feng; Gay, David; Brewer, Eric. Autolocker: Synchronization Inference for Atomic Sections. Conference record of the 33rd ACM SIGPLAN-SIGACT Symposium on Principles of Programming Languages, January 2006. Pages 346-358.
  • McGowen, R.; Poirier, C.A.; Bostak, C.; Ignowski, J.; Millican, M.; Parks, W.H.; Naffziger, S.Power and Temperature Control on a 90- nm Itanium Family Processor. IEEE Journal of Solid-State Circuits, Volume 41, Issue 1, January 2006. Pages 229-237. Digital Object Identifier 10.1109/JSSC.2005.859902.
  • Menon, Vijay S.; Glew, Neal; Murphy, Brian R.; McCreight, Andrew; Shpeisman, Tatiana; Adl-Tabatabai, Ali-Reza; Petersen, Leaf. A Verifiable SSA Program Representation for Aggressive Compiler Optimization. Conference Record of the 33rd ACM SIGPLAN-SIGACT Symposium on Principles of Programming Languages, January 2006. Pages 397-408.
  • Miaobo, C.; Goldenberg, S.; Srinivas, S.; Ushakov, V.; Wang, Y.; Qi, Z.; Lin, E.; Zach, Y.Java JNI Bridge: A Framework for Mixed Native ISA Execution. International Symposium on Code Generation and Optimization, March, 2006. Pages 65-75. Digital Object Identifier 10.1109/CGO.2006.22.
  • Mitra, S.; Kim, K.S. XPAND: An Efficient Test Stimulus Compression Technique. IEEETransactions on Computers, Volume 55, Issue 2, February 2006. Pages 163-173. Digital Object Identifier 10.1109/TC.2006.31.
  • Obradovic, B.; Kotlyar, R.; Heinz, F.; Matagne, P.; Rakshit, T.; Giles, M. D.; Stettler, A.; Nikonov, D. E. Analysis of Graphene Nanoribbons as a Channel Material for Field-Effect Transistors. Applied Physics Letters, Volume 88, April 2006.
  • Ong, Shao Chee. Enabling Test-Time Optimized Pseudorandom Bit Stream (PRBS) 2^31 BER Testing on Automated Test Equipment for 10Gbps Device. Third IEEE International Workshop on Electronic Design, Test and Applications, January 2006. Pages 68-73. Digital Object Identifier 10.1109/DELTA.2006.44.
  • Pan, Sung-Jui (Song-Ra); Cheng, Kwang-Ting; Moondanos, John; Hanna, Ziyad. Generation ofShorter Sequences for High Resolution Error Diagnosis Using Sequential SAT. Proceedings of the 2006 Conference on Asia South Pacific Design Automation, January 2006. Pages 25-29.
  • Peterson, Larry; Roscoe, Timothy. The Design Principles of PlanetLab. ACM SIGOPS Operating Systems Review, Volume 40, Issue 1, January 2006. Pages 11-16.
  • Ramanathan, S.; Chrysler, G.M. Solid-State Refrigeration for Cooling Microprocessors. IEEE Transactions on Components and Packaging Technologies [see also IEEE Transactions on Components,Packaging and Manufacturing Technology, Part A: Packaging Technologies] Volume 29, Issue 1, March 2006. Pages 179-183. Digital Object Identifier 10.1109/TCAPT.2006.
  • Raub, Alex K.; Biswas, Abani M.; Borodovsky, Y.; Allen, G.; Brueck, S. R. J. Simulation ofDense Contact Hole (1=0.35) Arrays with 193 nm Immersion Lithography. Proceedings of SPIE—Volume 6154, Optical Microlithography XIX, March 2006.
  • Ritenour, A.; Khakifirooz, A.; Antoniadis, D.A.; Lei, R. Z.; Tsai, W.; Dimoulas, A.; Mavrou, G.; Panayiotatos, Y. Subnanometer-Equivalent-Oxide-Thickness Germanium P-Metal-Oxide-SemiconductorField Effect Transistors Fabricated Using Molecular-Beam-Deposited High-K/Metal Gate Stack. Applied Physics Letters, Volume 88, April 2006.
  • Roberts, Jeanette M.; Meagley, Robert; Fedynyshyn, Theodore H.; Sinta, Roger F.; Astolfi, David K.; Goodman, Russell B.; Cabral, Alberto. Contributions to Innate Material Roughness in Resist. Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March 2006.
  • Shroff, Yashesh A.; Goldstein, Michael; Rice, Bryan; Lee, Sang H.; Ravi, K. V.; Tanzil, Daniel.EUV Pellicle Development for Mask Defect Control. Proceedings of SPIE—Volume 6151, Emerging Lithographic Technologies X, March 2006.
  • Slonaker, Steve D.; Phillips, Mark C.; Treadway, Chris; Darby, Greg; Johnson, Kurt; Moore, Bob. Advances in Imaging Tool Adjustment Optimization Methodologies and Capabilities Including Impact Upon Imaging Performance Budget Components. Proceedings of SPIE—Volume 6154, Optical Microlithography XIX, March 2006.
  • Soderquist, P.; Leeser, M.; Rojas, J.-C. Enabling MPEG-2 Video Playback in Embedded Systemsthrough Improved Data Cache Efficiency. IEEE Transactions on Multimedia, Volume 8, Issue 1,February 2006. Pages 81-89. Digital Object Identifier 10.1109/TMM.2005.861289.
  • Stepanenko, N.; Kim, Hyun-Woo; Kishimura, S.; van den Heuvel, D.; Vandenbroeck, N.; Kocsis, M.; Foubert, P.; Maenhoudt, M.; Ercken, M.; Van Roey, Frieda; Gronheid, R.; Pollentier, I.; Vangoidsenhoven, D.; Delvaux, C; Baerts, C.; O'Brien, S.; Fyen, W.; Wells, G. Top Coat or No Top Coat for Immersion Lithography? Proceedings of SPIE—Volume 6153, Advances in Resist Technology and Processing XXIII, March, 2006.
  • Want, R. An Introduction to RFID Technology. IEEE Pervasive Computing, Volume 5, Issue 1, January - March 2006. Pages 25-33. Digital Object Identifier 10.1109/MPRV.2006.2.
  • Want, R. Grasping the Torch. IEEE Pervasive Computing, Volume 5, Issue 1, January – March 2006. Pages 4-6. Digital Object Identifier 10.1109/MPRV.2006.7.
  • Webb, Clair. Layout Rule Trends and Effect upon CPU Design. Proceedings of SPIE—Volume6156, Design and Process Integration for Microelectronic Manufacturing IV, March 2006.
  • Yang, Shih-yu; Papachristou, C.A. A Method for Detecting Interconnect DSM Defects in Systems on Chip. IEEE Transactions on Computer- Aided Design of Integrated Circuits and Systems, Volume 25, Issue 1, January 2006. Pages 197-204. Digital Object Identifier 10.1109/TCAD.2005.853707.
  • Zhang, Chengliang; Ding, Chen; Ogihara, Mitsunori; Zhong, Yutao; Wu, Youfeng. A Hierarchical Model of Data Locality. Conference Record of the 33rd ACM SIGPLAN-SIGACT Symposium on Principles of Programming Languages, January 2006. Pages 16-29.
  • Zhang, K.; Bhattacharya, U.; Zhanping, C.; Hamzaoglu, F.; Murray, D.; Vallepalli, N.; Wang, Y.; Zheng, B.; Bohr, M. A 3-GHz 70-MB SRAM in 65-nm CMOS Technology with Integrated Column-Based Dynamic Power Supply. IEEE Journal of Solid-State Circuits, Volume 41, Issue 1, January 2006. Pages 146-151. Digital Object Identifier 10.1109/JSSC.2005.859025.
  • Zhuoyu B.; Kumar, S.A.; Wu, D.M.; Natarajan, V.K.; Lin, M. A Low Cost, High Quality Embedded Array DFT Technique for High Performance Processors. Third IEEE International Workshop onElectronic Design, Test and Applications, January 2006. Pages 57-63. Digital Object Identifier 10.1109/DELTA.2006.5.
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