|
[1] M. Ruberto, T. Maimon, Y. Shemesh, A. Desormeaux, W. Zhang, C. Yeh, "Consideration of Age Degradation in the RF
Performance of CMOS Radio Chips for High Volume Manufacturing," IEEE RFIC Symposium, Long Beach, CA, June 2005, pp.
549-552.
[2] "PCI Express Mini Card Electromechanical Specification," Revision 1.1; March 28, 2005, PCI-SIG.
|