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Functional Area: E-Test/Sort
Hello, I'm Richie. Welcome to E-Test/Sort. This is the end of the line for the wafers in the Fab.

What Happens Here?
E-Test/Sort is the last step in the manufacturing process. Here we test each die to make sure it performs correctly. It is very difficult to make wafers that have all the die working properly, so we need to "sort" them into good and bad die.

How do we do this? In E-Test/Sort all the wafers are tested for possible failures and sorted into good and bad die.
In E-Test a test signal is sent through the die. This will tell us whether the different circuits are working or not. If the wafers pass E-Test they are sent on to Sort where we test the speed of the die and sort them accordingly. The wafer has now completed its journey through the Fab. The silicon has been converted into functioning die. These die must now be assembled on packages and further tested before they are assembled into computers. This takes place in one of our Assembly Test plants located in the U.S or Asia.

Start Diffusion Ion Implant Thin Films
Planar Lithography Etch Etest
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