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Environmental Citizenship

Intel expands its environmental focus to include the impact from electronics manufacturing and electronic products.

Non-Destructive Testing

Non-destructive techniques like X-ray, SAM, SQUID, TDR, and thermal imaging provide data without altering the electronic device; details provided.

Parametric Fault Isolation

Parametric fault isolation analyzes electrical behavior of input/output circuitry using an SPA; includes graph.

Physical and Composition Analysis

Describes focused ion beam, scanning electron microscopy, and transmission electron microscopy tools used in physical and composition analysis.

Intel® 6300ESB I/O Controller Hub Datasheet

For Original Equipment Manufacturers and BIOS vendors creating products based on the Intel® 6300ESB I/O Controller Hub.

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Intel® 6300ESB I/O Controller Hub: Thermal Guide

Thermal and Mechanical Design Guide: Intel® 6300ESB I/O Controller Hub.

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Accelerating the Pace of Enhanced Crop Development

Case Study: Biotech firm BASF Plant Science refreshes crop development on the Intel® Xeon® processor E7 family, reducing new product time-to-market.

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IRC Fab Equipment List, April 2012

Chart: lists supplier, model number, description, Ceid, wafer size and functional area of IRC Fab equipment.

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Deploying Tablets in Manufacturing to Boost Productivity

Using ruggedized tablets and Ultrabook™ convertibles in manufacturing areas showed benefits in efficiency, accuracy, and savings.

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Factory Mobile Computing Proves Enterprise Value of 2-in-1 Devices

Intel IT is deploying 2-in-1 combination laptop and tablet mobile computing devices to improve productivity and produce time and cost savings.

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