Keith A. Bowman is a Staff Research Scientist in the Circuit Research Lab (CRL) at Intel Corporation in Hillsboro, OR. He received the B.S. degree in electrical engineering from North Carolina State University in 1994 and the M.S. and Ph.D. degrees in electrical engineering from the Georgia Institute of Technology in 1995 and 2001, respectively.
From 2001 to 2004, he worked as a Senior Computer-Aided Design (CAD) Engineer in the Technology-CAD Group at Intel in Hillsboro, OR to develop and support statistical-based models, methodologies, and software tools to predict microprocessor performance and power variability. Since joining CRL in 2004, his research has focused on the development of variation-tolerant circuits and design techniques to mitigate the adverse effects of parameter variations on microprocessor performance and power. His research has resulted in 15 refereed international journal publications, 45 refereed international conference papers, one book chapter, and over 20 tutorials at international conferences and universities on variation-tolerant circuit designs. He has mentored five Semiconductor Research Corporation (SRC) university research projects, four Intel-funded university research projects, a doctoral student at Carnegie Mellon University as a thesis committee member, and numerous graduate students. He has served on the technical program committees (TPC) for ISQED from 2007 to 2012 and ICICDT from 2005 to 2012. He was the TPC chair for the 2012 ISQED.