Dashboard

Find Content

Refine Results
Related Content

Selected Filters

  • 6536 Results
  • Items Per Page

Intel® Atom™ Processor D400 Series Specification Update

Specification Update: Intel® Atom™ processor D400 series device and document errata, clarifications, and changes. (v.9, Jul. 2014)

Preview | Download

Intel® Atom™ Processor E3800 Product Family: Brief

Platform Brief: For intelligent systems, the Intel® Atom™ processor E3800 product family delivers compute, graphics, and media. (v.2, Jul. 2014)

Preview | Download

Intel® 22nm Technology

Introducing 3-D transistors manufactured at 22nm for future microprocessor families, continuing pursuit of Moore's Law.

Intel’s Tick Tock Model

Intel's Tick-Tock model maintains an innovation cadence in microprocessor manufacturing and microarchitecture with new advancements every other year.

Intel® 32nm Logic and SOC Technologies

The innovative Intel 32nm logic technology is a revolutionary technical breakthrough, which delivers record NMOS and PMOS transistor performance.

Gate Dielectric Scaling for High-Performance CMOS: SiO2 to High-K

Gate Dielectric Scaling for High-Performance CMOS: SiO2 to High-K, an option for the 45nm high-performance logic technology node.

Preview | Download

Strained Germanium QWFE Transistor as P-Channel Device Option for Low Power III-V CMOS Architecture

Demonstrates a Germanium p-channel QWFET with thin scaled TOXE and high mobility, delivering four times higher hole mobility.

Preview | Download

Advanced High-K Gate Dielectric for Short-Channel in QWFE Transistors on Silicon Substrate

Paper: composite high-K gate in the QWFET silicon substrate integration for thin electrical oxide, low gate leakage, and carrier confinement.

Preview | Download

High-κ Gate Dielectrics, Metal Gate Electrodes in Silicon and Non-Silicon Logic Nanotechnology

Discusses low gate-leakage silicon and non-silicon transistor nanotechnology using high-κ gate dielectrics and metal gate electrodes.

Preview | Download

High-k/Metal-Gate Stack and Its MOSFET Characteristics

Article, IEEE Election Device Letters, Vol 25, No. 6, June 2004: High-k/Metal-Gate Stack and Its MOSFET Characteristics.

Preview | Download